An aerospace prime contractor measured a 2″ dia. Laser Black sample (aluminum substrate) provided by Epner Technology on a Perkin Elmer 983 Spectrophotometer at a range of 2-5um, as well as a zero no sample measurement, an uncoated fused silica measurement and a plot. Along with the reflectance graph, they included directional hemispheric reflectance data from a Surface Optics Corp. SOC 410 instrument, which measures the diffuse and specular reflectance averaged over a filter bandwidth. For comparison, they also included a couple of other samples of black surface treatment.
